| 摘要 |
PURPOSE:To accurately inspect the mounting inclination and the soldering state of a bipolar chip part. CONSTITUTION:This apparatus is provided with a parallel light source 2 for illuminating a bipolar chip part 11 from a direction orthogonal to an axis connecting the soldered electrodes of the bipolar chip part 11, and a photographing camera 13 so arranged as to allow the regular reflection light to enter a surface of the parallel light source 12 parallel to a surface where the part is mounted. The silhouette generated from the bipolar chip part 11 and a fillet is extracted as a dark part from the image of the photographing camera 13 by a cutting part 15. The length l1. l2 of each of two points is measured by a mounting inspecting part 16. Whether the mounting inclination is proper or not is determined by the comparison of the difference of the lengths and a preset value. |
