发明名称 FIELD-EFFECT TRANSISTOR FORMED IN A SEMI-INSULATING SUBSTRATE
摘要 <p>Disclosed is a semiconductor device having a field effect transistor (FET) formed in a semi-insulative substrate (22). A positive bias voltage equal to or higher than the bias voltage applied to the drain electrode (27) of the FET is applied to a back surface electrode (29) formed on the back surface of the substrate (22), with the result that the electrons generated within the semi-insulative substrate (22) are pulled into the back surface electrode (29) so as to prevent said electrons from flowing into the drain region (24) and, thus, to prevent modulation of the drain current.</p>
申请公布号 EP0265593(B1) 申请公布日期 1993.08.18
申请号 EP19870108583 申请日期 1987.06.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 INOUE, KAZUHIKO C/O PATENT DIVISION;TOMISAWA, YUTAKA C/O PATENT DIVISION
分类号 H01L23/12;H01L21/338;H01L27/02;H01L29/10;H01L29/812 主分类号 H01L23/12
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