发明名称 LITHOGRAPHY METHOD AND MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable a two-dimensionally shaped etching mask pattern to be formed by a method wherein two functions, a catalyst producing function and a latent image forming function, of chemical amplification resist are separately given to two layers respectively. CONSTITUTION:An aluminum film 5 is formed on a silicon semiconductor substrate 6, and a lower resist layer 4, a catalyst producing layer 3, and a latent image forming layer 2 are successively formed. In succession, this specimen is irradiated with an electron beam as activating chemical rays through the latent image forming layer 2 to draw a prescribed wiring pattern for the formation of a catalyst producing part 7. Then, the specimen is baked to diffuse catalyst into the latent image forming layer 2 from the catalyst producing part 7 to form a latent image 8 corresponding to the pattern concerned. A developed pattern 9 can be obtained by developing the latent image forming layer 2, the catalyst producing layer 3 and the lower resist layer 4 are etched through the developed pattern 9 as a mask to obtain a resist pattern 10, and a wiring layer 5 is dry-etched using the resist pattern 10 as mask. By this setup, fine work can be carried out high in accuracy.
申请公布号 JPH05205989(A) 申请公布日期 1993.08.13
申请号 JP19920012814 申请日期 1992.01.28
申请人 HITACHI LTD;HITACHI CHEM CO LTD 发明人 SHIRAISHI HIROSHI;SOGA TAKASHI;MURAI FUMIO;SAKAMIZU TOSHIO;HAYASHI NOBUAKI
分类号 G03F7/038;G03F7/039;G03F7/26;G03F7/38;H01L21/027;H01L21/3213 主分类号 G03F7/038
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