| 摘要 |
PURPOSE:To simply reduce white flaws on reproduced by a method wherein crystal defects caused by the creeping of metal ions or the like due to a change with the passage of time can be restored without dismantling a solid-state image sensing device. CONSTITUTION:A CCD image sensor is constituted by housing the following inside a package 2: a CCD solid-state image sensing element 1 wherein a getter layer is formed on the rear of a silicon substrate and a photodetection part and a CVD register are formed on the surface of the silicon substrate; and a sheetlike substrate electrode 3 which is arranged on the rear surface of the CCD solid-state image sensing element 1. The CCD image sensor is constituted by arranging a heater 5 on the rear surface of the substrate electrode 3 via a sheetlike insulator 4. The heater 5 is constituted of a resistance pattern 7 formed on the surface of, e.g. a sheetlike insulator 6 by using a well-known thick-film formation technique. |
