发明名称 DRYING AND HIGH-TEMPERATURE TESTING EQUIPMENT FOR LEAD FRAME PROVIDED WITH ELECTRONIC COMPONENT
摘要 <p>PURPOSE:To miniaturize equipments and enable automating, in the case where a lead frame provided with an electronic component like a photo interrupter is dried after a cleaning process is ended, and then a performance test is performed at a high temperature. CONSTITUTION:A rotary body 7 rotating in the state that lead frames A1, A2 provided with electronic components are mounted on a plurality of portions of the periphery is installed in a box 5. A probe unit 8 for bringing current applying probes 8e, 8f into contact with the lead terminals of the lead frames A1, A2 is installed in a box 5. Further, in the box 5, a heating means for increasing the temperature in the box 5 up to a specified value is installed, and, in addition, conveying means 13, 14, 16 for supplying the lead frames A1, A2 provided with electronic parts to the rotary body 7, transferring the lead frames from the rotary body 7 to the probe unit 8, and sending out the lead frames from the probe unit 8 are installed.</p>
申请公布号 JPH05206244(A) 申请公布日期 1993.08.13
申请号 JP19920014234 申请日期 1992.01.29
申请人 ROHM CO LTD 发明人 IMABAYASHI HIDEFUMI;NAKAMURA NOBUYUKI
分类号 G01N27/38;H01L21/304;H01L21/66;H01L31/12 主分类号 G01N27/38
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