发明名称 Process of developing an image-wise exposed resist-coated substrate
摘要 A block copolymer novolak resin composition comprising at least one unit of the reaction product of an alkali-soluble phenolic polymer and a reactive ortho, ortho bonded oligomer having the formula: <IMAGE> (I) wherein x is from 2 to 7; wherein R is selected from hydrogen a lower alkyl group or lower alkoxy group having 1-4 carbon atoms and a halogen group; and Y1 is either a hydroxyl group; an alkoxy group or a halogen group; and Y2 is hydrogen, alkyl, alkoxy, halogen, hydroxyl, -CH2OH, -CH2- halogen, or -CH2-alkoxy group.
申请公布号 US5234795(A) 申请公布日期 1993.08.10
申请号 US19920979890 申请日期 1992.11.23
申请人 OCG MICROELECTRONIC MATERIALS, INC. 发明人 JEFFRIES, III, ALFRED T.;HONDA, KENJI;BLAKENEY, ANDREW J.;TADROS, SOBHY
分类号 G03F7/023 主分类号 G03F7/023
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