发明名称 |
Process of developing an image-wise exposed resist-coated substrate |
摘要 |
A block copolymer novolak resin composition comprising at least one unit of the reaction product of an alkali-soluble phenolic polymer and a reactive ortho, ortho bonded oligomer having the formula: <IMAGE> (I) wherein x is from 2 to 7; wherein R is selected from hydrogen a lower alkyl group or lower alkoxy group having 1-4 carbon atoms and a halogen group; and Y1 is either a hydroxyl group; an alkoxy group or a halogen group; and Y2 is hydrogen, alkyl, alkoxy, halogen, hydroxyl, -CH2OH, -CH2- halogen, or -CH2-alkoxy group.
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申请公布号 |
US5234795(A) |
申请公布日期 |
1993.08.10 |
申请号 |
US19920979890 |
申请日期 |
1992.11.23 |
申请人 |
OCG MICROELECTRONIC MATERIALS, INC. |
发明人 |
JEFFRIES, III, ALFRED T.;HONDA, KENJI;BLAKENEY, ANDREW J.;TADROS, SOBHY |
分类号 |
G03F7/023 |
主分类号 |
G03F7/023 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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