发明名称 MANUFACTURE OF CANTILEVER FOR INTERATOMIC FORCE MICROSCOPE
摘要 PURPOSE:To enable the obtaining of sufficient information as microscope with higher strength of a cantilever by mounting a diamond tip at the tip of the cantilever. CONSTITUTION:A photoresist 6 is formed on the rear of a mono-crystalline silicon wafer 1 and undergoes a patterning to etch the wafer 1 with the resist 6 patterned as mask. The resist 6 is peeled off to inscribe 7 on the side of the surface of the wafer 1 and a nucleus is made to develop and grow a diamond 2 as probe. An oxide film 8 is formed on the surface of the wafer 1 and further, a nitride film 4 on the surface thereof. Then, a spin coating of the resist 6 is applied on the surface of the wafer 1 and the resist 6 is removed according to the patterning. With the resist patterned as mask, the film 4 is etched on the surface of the wafer and the film 4 on the rear thereof is removed. Thereafter, the resist 6 is removed. The part etched is further etched until the film 8 on the rear of the wafer 1 and the diamond 2 are exposed. Then, a metal thin film is made to grow at the part etched.
申请公布号 JPH05203444(A) 申请公布日期 1993.08.10
申请号 JP19920014264 申请日期 1992.01.29
申请人 SEIKO INSTR INC 发明人 YOSHINO TOMOYUKI
分类号 G01B21/30;G01N37/00;G01Q60/38;H01J9/14;H01J37/28 主分类号 G01B21/30
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