| 摘要 |
<p>PURPOSE:To facilitate measurement of a thickness by adding a simple function to a conventional investigating apparatus. CONSTITUTION:A conventional apparatus is provided with a means 71 for detecting positions of the respective first peak voltages of transmission and reception waves, a means 72 for detecting a delay time (t) at the positions of these first peak voltages of the transmission and reception waves and a means 73 for setting beforehand a relative dielectric constant 5 of an object of measurement. Only a measured value of a thickness is displayed as a line profile in a display device 5.</p> |
