发明名称 Method of fabricating vertically integrated oxygen-implanted polysilicon resistor
摘要 A method for fabricating a high value, vertically integrated resistor begins with an integrated circuit having an unpassivated upper surface that includes designated circuit nodes to be placed in series with the vertical resistor. A layer of passivating material such as boro-phospho silicate glass is deposited on the upper surface of the integrated circuit. Polysilicon vias are formed that extend through the passivating layer and form an electrical ohmic contact with each designated circuit node. The polysilicon vias are subsequently ion implanted with oxygen or nitrogen to increase the resistance thereof to the final desired resistance, which can be greater than 100 megohms, and as much as a gigohm or a terohm. Finally, the vertical resistor is contacted with a metal layer formed on the surface of the passivating layer.
申请公布号 US5232865(A) 申请公布日期 1993.08.03
申请号 US19920915067 申请日期 1992.07.15
申请人 MICRON TECHNOLOGY, INC. 发明人 MANNING, MONTE;LEE, ROGER
分类号 H01L21/02;H01L27/11 主分类号 H01L21/02
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