发明名称 GROWTH APPARATUS OF SILICON OXIDE FILM
摘要 PURPOSE:To improve the selectivity to resist or wiring and provide a growth apparatus of a silicon oxide film capable of controlling the occurrence of particles in the growth apparatus of the selective oxide film by a liquid phase growth method. CONSTITUTION:The present apparatus includes a discrete type treating bath 1 for forming a film by a face down method. The inside of the treating bath 1 and a water pipe 13 is treated with a Teflon, and the occurrence of particles is reduced. Then, a treatment for forming the film is performed for a certain time, and an adhesion of the particles is prevented. Further, the apparatus provides a wafer transfer robot 15 for automatically performing a wafer transfer between the treating bath 1 and a spin etch part 16. Therefore, the occurrence of particles is reduced and the life of treating liquid can be prolonged about 2 times. Further, a silicon oxide film adhering or growing on a photoresist pattern or a metal wiring pattern can substantially be removed.
申请公布号 JPH05190475(A) 申请公布日期 1993.07.30
申请号 JP19920019549 申请日期 1992.01.08
申请人 NEC CORP 发明人 KURIYAMA ATSUSHI
分类号 H01L21/208;H01L21/00;H01L21/316 主分类号 H01L21/208
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