发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY AND ITS OPERATING METHOD |
摘要 |
<p>PURPOSE:To reduce the variation of the threshold value of a cell after drawing electric charge by injecting avalanche hot carrier(AHC) into a charge storage part after emitting electrons. CONSTITUTION:When an erasing operation controller 30 is activated, F-N tunnel erase control circuit 26 is supplied with a signal S2 to be activated. Then, a memory cell array 14 is supplied with an erase signal S3 so that electron is drawn from a floating gate by F-N tunnel current. Subsequently, AHC injection control circuit 28 is supplied with a signal S4 to supply the memory cell array 14 with an injection signal S5. Accordingly, AHE or AHH is injected into the floating gate so that the threshold value of a cell is tuned. Consequently, the cell threshold value having caused variation after drawing of electron by the F-N tunnel current converges on a balanced threshold voltage.</p> |
申请公布号 |
JPH05190866(A) |
申请公布日期 |
1993.07.30 |
申请号 |
JP19920164970 |
申请日期 |
1992.06.23 |
申请人 |
TOSHIBA CORP;TOSHIBA MICRO ELECTRON KK |
发明人 |
NARUGE KIYOMI;SUZUKI TOMOKO;YAMADA SEIJI;KOO ETSUSHI;OSHIKIRI MASAMITSU |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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