发明名称 NONVOLATILE SEMICONDUCTOR MEMORY AND ITS OPERATING METHOD
摘要 <p>PURPOSE:To reduce the variation of the threshold value of a cell after drawing electric charge by injecting avalanche hot carrier(AHC) into a charge storage part after emitting electrons. CONSTITUTION:When an erasing operation controller 30 is activated, F-N tunnel erase control circuit 26 is supplied with a signal S2 to be activated. Then, a memory cell array 14 is supplied with an erase signal S3 so that electron is drawn from a floating gate by F-N tunnel current. Subsequently, AHC injection control circuit 28 is supplied with a signal S4 to supply the memory cell array 14 with an injection signal S5. Accordingly, AHE or AHH is injected into the floating gate so that the threshold value of a cell is tuned. Consequently, the cell threshold value having caused variation after drawing of electron by the F-N tunnel current converges on a balanced threshold voltage.</p>
申请公布号 JPH05190866(A) 申请公布日期 1993.07.30
申请号 JP19920164970 申请日期 1992.06.23
申请人 TOSHIBA CORP;TOSHIBA MICRO ELECTRON KK 发明人 NARUGE KIYOMI;SUZUKI TOMOKO;YAMADA SEIJI;KOO ETSUSHI;OSHIKIRI MASAMITSU
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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