发明名称 SINGLE MODULE TEST SUPPORT SYSTEM
摘要 PURPOSE:To improve the efficiency of a test support system by automatically setting a test environment such as the securing of areas which a module uses and the connection of the areas. CONSTITUTION:The single module test support system is provided with a data structure information extraction part 3 analyzing the single module of a test object and extracting structure information on all data on the single module, a variable area securing part 7 securing respective pieces of data and the areas in size corresponding to respective pieces of data, which are connected to respective pieces of data based on data structure information, and setting chain information which connects the connected areas, and the system automatically secures the areas required for the execution of the tested single module.
申请公布号 JPH05189228(A) 申请公布日期 1993.07.30
申请号 JP19920004761 申请日期 1992.01.14
申请人 HITACHI LTD;HITACHI TOHOKU SOFTWARE KK;HITACHI VLSI ENG CORP 发明人 OSHIMA MASAYUKI;HASHIGAYA MAKOTO;KIDOGUCHI HIROMASA;NAKANO SHINKICHI
分类号 G06F9/06;G06F11/28 主分类号 G06F9/06
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