发明名称 METHOD FOR TESTING INPUT/OUTPUT DEVICE
摘要 PURPOSE:To test an input/output device in parallel with a general job under the control of an operating system. CONSTITUTION:The test job 22 of the same rank as the general job 21 is placed under the control of the operating system (OS) 20 of a computer system, and in the operating system (OS) 20, either an input/output device testing part 201/201a whose interface for the input/output device (I/O) 4 is made the same as a device driver 200 is provided, or the input/output device testing part 201/201a uses the device driver 200 in the operating system (OS) 20, and when only one test execution instructing command (1) is issued from the test job to the input/output device testing part 201/201a under the control of the above- mentioned operating system (OS) 20, the input/output device testing part 201/201a accesses the input/output device (I/O) 4 through the interface of the device driver 200, and executes the test of the input/output device (I/O) 4 in parallel with the general job 21 on the basis of the test execution instructing command (1).
申请公布号 JPH05189262(A) 申请公布日期 1993.07.30
申请号 JP19920005366 申请日期 1992.01.16
申请人 FUJITSU LTD 发明人 ADACHI HIDEKI
分类号 G06F11/22;G06F13/00 主分类号 G06F11/22
代理机构 代理人
主权项
地址