| 摘要 |
<p>The present invention relates to a method and a system for testing the operation and/or for the presence of elements connected in parallel. The components (3) to be tested are capable of being in two states generating different thermal radiation. For the case of directly tested diodes, these two states correspond to the forward biased state and the reverse biased state. The method according to the invention provides for supplying the assembly with a square-wave signal (2') of frequency f and of amplitudes a and b chosen to set this assembly in a predetermined succession of states, chosen from the two states. The method then consists in detecting the thermal radiation output by each element, converting it into a workable signal, then checking synchronism of this signal with the frequency f. This check makes it possible, depending on the expected operation of the components tested, to deduce breakdown or correct operation of a component and/or whether it is present in the assembly. <IMAGE></p> |
