发明名称 |
Millimeter-wave active probe system |
摘要 |
Three classes of active probes all with coaxial inputs and coplanar waveguide probe tips are described. A millimeter-wave active probe for generating signals with frequencies about 50 gHz and supplying same to millimeter-wafer including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections and nonlinear elements are integrated in uniplanar transmission line medium. Also disclosed is a harmonic mixer probe to step down RF received from an integrated circuit to a lower frequency by mixing it with the harmonics of a local oscillator signal. Also disclosed is an S-parameter active probe for on-wafer measurement of the S-parameters of a two port millimeter-wave device or integrated circuit by injecting millimeter-wave frequencies and simultaneously tapping off a portion of the injected signal, the transmitted signal and the reflected signal and stepping all signals down in frequency to a frequency compatible with currently available test equipment such as the HP8510 automatic network analyzer. This is the first and only all-electronic millimeter-wave on-wafer S-parameter measurement device available at present.
|
申请公布号 |
US5231349(A) |
申请公布日期 |
1993.07.27 |
申请号 |
US19900585425 |
申请日期 |
1990.12.24 |
申请人 |
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY |
发明人 |
MAJIDI-AHY, GHOLAMREZA;BLOOM, DAVID M. |
分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|