发明名称 METHOD OF TREATING SURFACE OF SI-DOPED SEMICONDUCTOR EPITAXIAL GROWTH SUBSTRATE
摘要 <p>PURPOSE:To provide a method of treating the surface of an Si-doped semiconductor epitaxial growth substrate, which is capable of etching away selectively an Si crystal deposited on the surface of an epitaxial layer. CONSTITUTION:An Si-doped semiconductor epitaxial growth substrate is dipped in a strong alkali solution and an Si crystal deposited on the surface of an epitaxial layer is etched away. The Si crystal deposited in a mountain range form on the surface of the epitaxial layer can be selectively etched away. Accordingly, the use of a high-cost apparatus can be dispensed with. Moreover, as the Si crystal is not shaved off mechanically from the surface of the epitaxial layer, the surface of the epitaxial layer is never marred, the cause of a failure of cracking a wafer can be eliminated and the yield in the production of the wafer is improved.</p>
申请公布号 JPH05182949(A) 申请公布日期 1993.07.23
申请号 JP19910359637 申请日期 1991.12.28
申请人 MITSUBISHI CABLE IND LTD 发明人 KINOSHITA HIROAKI;NAKAOKA WATARU
分类号 H01L21/308;H01L33/30 主分类号 H01L21/308
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