发明名称 WAFER COOLING SYSTEM
摘要 <p>PURPOSE:To provide the title wafer cooling system capable of efficiently forced- cooling semiconductor wafers without lowering the vacuum degree in a vacuum chamber of a dry-etching device. CONSTITUTION:The title wafer cooling system to cool down a wafer (1) mounted on the surface of a stage (2) equipped with cooling means (4) almost horizontally arranged in h vacuum chamber of a dry-etching device of the wafer (1) is composed of a sealing member (5) arranged in a ring shape on the surface periphery of the stage (3), a gas feed port (6) and a gas exhaust port (7) formed in the central part encircled by the sealing member (5) on the stage surface as well as a gas feed and exhaust control part (8) feeding helium gas (9) from the gas feed port (6) to a fine gap (G) encircled by the stage (3), the sealing member (5) and the wafer (1) while exhausting the over-fed helium gas (9) from the exhaust port (7) so as to fluidally fill up the gap (G) with the helium gas (9).</p>
申请公布号 JPH05182930(A) 申请公布日期 1993.07.23
申请号 JP19910316735 申请日期 1991.11.29
申请人 NICHIDEN MACH LTD;HAKUTOU KK 发明人 NAGASAWA TORU;GOCHI ISAMU
分类号 F25D17/02;F25D31/00;H01L21/302;H01L21/3065;H01L21/68;H01L21/683 主分类号 F25D17/02
代理机构 代理人
主权项
地址