发明名称 |
WAFER COOLING SYSTEM |
摘要 |
<p>PURPOSE:To provide the title wafer cooling system capable of efficiently forced- cooling semiconductor wafers without lowering the vacuum degree in a vacuum chamber of a dry-etching device. CONSTITUTION:The title wafer cooling system to cool down a wafer (1) mounted on the surface of a stage (2) equipped with cooling means (4) almost horizontally arranged in h vacuum chamber of a dry-etching device of the wafer (1) is composed of a sealing member (5) arranged in a ring shape on the surface periphery of the stage (3), a gas feed port (6) and a gas exhaust port (7) formed in the central part encircled by the sealing member (5) on the stage surface as well as a gas feed and exhaust control part (8) feeding helium gas (9) from the gas feed port (6) to a fine gap (G) encircled by the stage (3), the sealing member (5) and the wafer (1) while exhausting the over-fed helium gas (9) from the exhaust port (7) so as to fluidally fill up the gap (G) with the helium gas (9).</p> |
申请公布号 |
JPH05182930(A) |
申请公布日期 |
1993.07.23 |
申请号 |
JP19910316735 |
申请日期 |
1991.11.29 |
申请人 |
NICHIDEN MACH LTD;HAKUTOU KK |
发明人 |
NAGASAWA TORU;GOCHI ISAMU |
分类号 |
F25D17/02;F25D31/00;H01L21/302;H01L21/3065;H01L21/68;H01L21/683 |
主分类号 |
F25D17/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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