发明名称 DELAY-TIME MEASURING APPARATUS
摘要 <p>PURPOSE:To improve the measuring accuracy of a delay-time measuring apparatus for measuring a delay time by switching the amount of attenuation in response to the input level of a received signal. CONSTITUTION:A transmitting signal (a) outputted from a transmitting-signal generating circuit 1 is used. Thus, the difference in delay times caused by the difference in attenuation amounts of a digital-controlled attenuator 3 is measured before hand in response to the attenuation amount with a phase-difference measuring circuit 4 and a microcomputer 5. The difference is stored in a memory circuit 6. The delay time, which is measured by using the received signal (b) from an external circuit, is corrected by the time difference stored in the memory circuit 6.</p>
申请公布号 JPH05180960(A) 申请公布日期 1993.07.23
申请号 JP19910360343 申请日期 1991.12.30
申请人 NEC CORP 发明人 IGARASHI TOSHIBUMI
分类号 G04F10/00;H04B3/46 主分类号 G04F10/00
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