SEMICONDUCTOR DEVICE AND TESTING METHOD,申请号JP19910152391-传众专利搜索

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发明名称	SEMICONDUCTOR DEVICE AND TESTING METHOD
摘要
申请公布号	JPH05180901(A)	申请公布日期	1993.07.23
申请号	JP19910152391	申请日期	1991.05.28
申请人	TEXAS INSTR JAPAN LTD	发明人	SAKAMOTO HARUMI
分类号	G01R31/28;G01R31/30;G01R31/317;G11C11/401;G11C29/00;G11C29/06;G11C29/50;H01L21/66	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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