| 摘要 |
<p>An adaptive electrooptical lens system for use in optical data storage systems, optical phased arrays, laser or other optical projectors, and raster scanning devices, and the like. The invention provides an electrooptical means for scanning an optical beam or moving an optical storage or retrieval point. Beam movement is achieved electrooptically, by changing the index of refraction of an electrooptical material by controlling electric fields applied thereto. A plurality of electrodes are disposed on one surface of the electrooptic material and a ground electrode is disposed on the other. The electrodes are adapted to apply electric fields derived from a voltage source to the electrooptic material that selectively changes its index of refraction and provides for a predetermined index of refraction profile along at least one dimension thereof, thus forming a lens. By appropriately forming the electrode pattern and properly controlling the voltages applied thereto, differing lens shapes may be formed. Since the response times of the electrooptic materials employed in the present invention are on the order of nanoseconds (10-9 sec) or less, the intrinsic response frequency of the lens system is 109 Hz or more. The present invention thus increases the data storage and retrieval capacity of optical systems in which it is employed.</p> |
