METHOD FOR CALIBRATING IC TESTING DEVICE,申请号JP19910294711-传众专利搜索

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发明名称	METHOD FOR CALIBRATING IC TESTING DEVICE
摘要
申请公布号	JPH05133997(A)	申请公布日期	1993.05.28
申请号	JP19910294711	申请日期	1991.11.12
申请人	ADVANTEST CORP	发明人	HASHIMOTO YOSHIHIRO
分类号	G01R31/26;G01R35/00	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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