ELECTRICAL CONNECTORS AND IC CHIP TESTER EMBODYING SAME
摘要
A novel wadded wire-plunger contact is provided which possesses excellent durability and desired functional characteristics in a large variety of applications such as the testing of IC chips.
申请公布号
CA1320546(C)
申请公布日期
1993.07.20
申请号
CA19890615035
申请日期
1989.09.29
申请人
LABINAL COMPONENTS AND SYSTEMS, INC.
发明人
SHAH, ARUN J.;MCCLUNG, DAVID W.;HOPFER, ALBERT N.;LINDEMAN, RICHARD J.;ZAFAR, SAEED
