发明名称 |
SPECULAR POLISHING METHOD FOR CDTE WAFER |
摘要 |
<p>PURPOSE:To provide a specular polishing method for a CdTe wafer, which is equal to the conventional process about scratch and damage layer and which gives a specular surface having a surface roughness lower than the level according to the conventional process. CONSTITUTION:Mechanical polishing is made by the use of a polishing solution 6 containing abrasive grains and a polishing cloth 2, and as final process, a chemical polishing is conducted for a short time using a polishing solution of chemical type and a hard polishing cloth. These processes constitute a specular polishing method for a CdTe wafer.</p> |
申请公布号 |
JPH05177536(A) |
申请公布日期 |
1993.07.20 |
申请号 |
JP19920078588 |
申请日期 |
1992.02.27 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
HASHIO KATSUSHI;WAKAYAMA YOSHIHIRO |
分类号 |
B24B1/00;B24B37/00;H01L21/304 |
主分类号 |
B24B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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