发明名称 SPECULAR POLISHING METHOD FOR CDTE WAFER
摘要 <p>PURPOSE:To provide a specular polishing method for a CdTe wafer, which is equal to the conventional process about scratch and damage layer and which gives a specular surface having a surface roughness lower than the level according to the conventional process. CONSTITUTION:Mechanical polishing is made by the use of a polishing solution 6 containing abrasive grains and a polishing cloth 2, and as final process, a chemical polishing is conducted for a short time using a polishing solution of chemical type and a hard polishing cloth. These processes constitute a specular polishing method for a CdTe wafer.</p>
申请公布号 JPH05177536(A) 申请公布日期 1993.07.20
申请号 JP19920078588 申请日期 1992.02.27
申请人 SUMITOMO ELECTRIC IND LTD 发明人 HASHIO KATSUSHI;WAKAYAMA YOSHIHIRO
分类号 B24B1/00;B24B37/00;H01L21/304 主分类号 B24B1/00
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