发明名称 METHOD FOR FABRICATING RECRYSTALLIZED SEMICONDUCTOR FILM
摘要 A method for fabricating a recrystallized semiconductor film includes forming a polycrystalline or amorphous semiconductor film on a base having a melting point or softening temperature lower than the melting point of the semiconductor film, heating the base to melt it with a first heater, and melting the semiconductor film with a second heater and recrystallizing the semiconductor film while the base is molten. Thereby, generation of stress in the semiconductor film is prevented or reduced and the planarity of the semiconductor film is not damaged by distortion of the substrate and the temperature in the semiconductor film is uniform at the time of recrystallization. As a result, a recrystallized film with good crystallinity is obtained.
申请公布号 US5228948(A) 申请公布日期 1993.07.20
申请号 US19910802481 申请日期 1991.12.05
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 DEGUCHI, MIKIO
分类号 H01L21/20;H01L21/225;H01L21/84 主分类号 H01L21/20
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