发明名称 |
SELF-ALIGNED PHASE-SHIFTING MASK |
摘要 |
<p>SELF-ALIGNED PHASE-SHIFTING MASK A phase-shifting mask with self-aligned spacers of phase-shift material adjacent to the edges of the opaque mask pattern and a method for making the same is disclosed. The method of the invention deposits a blanket layer of an appropriate phase-shift material over a transparent mask substrate having a patterned opaque layer followed by a removal step which forms the spacers. The mask is preferably comprised of a quartz substrate covered with a patterned chrome layer fabricated following the normal inspection and repair procedure. A layer of phase-shift material is then blanket deposited. The thickness and index of refraction of the phase-shift material is chosen to provide a phase-shift of 0.67 pi radians (120 degrees) to pi radians (180 degrees) in the completed mask which is the range of phase-shift demonstrated to be effective. The phase-shift layer is then blanket etched anisotropically in a Reactive Ion Etch (RIE) chamber, using the chrome and quartz as etch stops. Following the etch, the remaining phase-shift material forms a roughly quarter-cylinder cross-section shaped spacer pattern. The spacer pattern is self-aligned to the edges of the opaque mask pattern.</p> |
申请公布号 |
CA2082869(A1) |
申请公布日期 |
1993.07.14 |
申请号 |
CA19922082869 |
申请日期 |
1992.11.13 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
YOUNG, MALCOLM A. |
分类号 |
G03F1/08;G03F1/00;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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