ELECTROOPTIC MEASUREMENT SYSTEMS FOR FREQUENTIAL ANALYSIS OF VERY WIDE RANGE SIGNALS

摘要

An electrooptic measurement system embodying the invention comprises a continuously transmitting laser source with small line width, an electrooptic modulator and a spectroscopic device. The electrooptic modulator supplies a light wave which is linearly modulated in amplitude by an electrical signal. This modulated light wave has a frequency spectrum comprised of a central line width corresponding to the central wave frequency of the light wave and of two sidebands each representing the frequency spectrum of the electrical signal. The spectrocopic device is e.g. comprised of a sweeping interferometer, an optical detector and an oscilloscope. It receives the modulated light wave and supplies a display of the frequency spectrum of the electrical signal. The measurement system has a pass range of the order of 8,000 GHz and is suited to the characterization of electronic components and hyperfrequency microcircuits by means of contactless in situ measurements.