发明名称 MANUFACTURE OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To form high quality capacitor lower electrode film and increase a capacitance and improve a throughput and form a lower electrode having a required film thickness. CONSTITUTION:A polycrystalline silicon film 3 or an amorphous silicon film is formed on a silicon substrate 1 with an oxide film 2 therebetween. Oxygen is introduced into a same chamber and an oxide film 4 which is almost a natural oxide film is formed on the surface of the polycrystalline silicon film 3 or the amorphous silicon film. After that, a rough-surface polycrystalline silicon film 6 which has an unevenness on its surface is formed on the surface of the oxide film 4. A capacitor lower electrode is composed of the rough-surface polycrystalline silicon film 6 and the polycrystalline silicon film 3 or the amorphous silicon film.
申请公布号 JPH05175456(A) 申请公布日期 1993.07.13
申请号 JP19910354316 申请日期 1991.12.20
申请人 MIYAZAKI OKI ELECTRIC CO LTD;OKI ELECTRIC IND CO LTD 发明人 KUROKI HIROKI;CHIN SEISHIYOU
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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