发明名称 |
MANUFACTURE OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE:To form high quality capacitor lower electrode film and increase a capacitance and improve a throughput and form a lower electrode having a required film thickness. CONSTITUTION:A polycrystalline silicon film 3 or an amorphous silicon film is formed on a silicon substrate 1 with an oxide film 2 therebetween. Oxygen is introduced into a same chamber and an oxide film 4 which is almost a natural oxide film is formed on the surface of the polycrystalline silicon film 3 or the amorphous silicon film. After that, a rough-surface polycrystalline silicon film 6 which has an unevenness on its surface is formed on the surface of the oxide film 4. A capacitor lower electrode is composed of the rough-surface polycrystalline silicon film 6 and the polycrystalline silicon film 3 or the amorphous silicon film. |
申请公布号 |
JPH05175456(A) |
申请公布日期 |
1993.07.13 |
申请号 |
JP19910354316 |
申请日期 |
1991.12.20 |
申请人 |
MIYAZAKI OKI ELECTRIC CO LTD;OKI ELECTRIC IND CO LTD |
发明人 |
KUROKI HIROKI;CHIN SEISHIYOU |
分类号 |
H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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