发明名称 SEMICONDUCTOR ELECTROSTATIC PROTECTION CIRCUIT
摘要 PURPOSE:To improve the electrostatic breakdown voltage of an input/output circuit. CONSTITUTION:When electrostatic protection against an output circuit is performed, a third n-type diffused region 48 is provided in addition to a first n-type diffused region 13 and a second n-type diffused region 14. The third n-type diffused region 48 is used as the drain of a thick-film field transistor 49 in (C). Thus, two field transistors 36 and 49 are connected in parallel with respect to a bonding pad 29. Both sources of the transistors are connected to a reference potential. In this way, electrostatic surge current, which are applied on the bonding pad 29, flow in parallel between the drains and the sources of two field transistors 36 and 49 and discharged to the reference potential. Thus, the protection of the inner output circuit is accomplished. &Z11: p-type substrate, a: to reference potential, b: to output gate, c: (X-X' cross section)
申请公布号 JPH05175439(A) 申请公布日期 1993.07.13
申请号 JP19910345325 申请日期 1991.12.26
申请人 KAWASAKI STEEL CORP 发明人 SHIMATANI TAKESHI
分类号 H01L21/82;H01L21/8234;H01L27/088 主分类号 H01L21/82
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