发明名称 |
WAFER DETECTOR FOR ROTARY WAFER PROCESSOR |
摘要 |
<p>PURPOSE:To accurately detect a wafer on a table irrespective of the type of the wafer and a difference of processing modes. CONSTITUTION:A table 2 for placing a wafer in a state for controlling horizontal movement of an outer peripheral edge of the wafer is rotatable around a vertical shaft core P, a high reflection are 6a and a low reflection area 6b having different reflectivities in a rotating direction are formed on an upper surface of the plate 2, and a light source 7 for projecting an optical beam to the areas 6a, 6b and a light receiver 8 for receiving the beam reflected on the area 6a or 6b and outputting a light reception signal are provided at upper positions on the plate 2. The reflected states from the areas 6a, 6b are sensed by a controller 15 based on the signal from the receiver 8 to decide presence or absence of the wafer.</p> |
申请公布号 |
JPH05175315(A) |
申请公布日期 |
1993.07.13 |
申请号 |
JP19910355185 |
申请日期 |
1991.12.19 |
申请人 |
DAINIPPON SCREEN MFG CO LTD |
发明人 |
SUGIMOTO KENJI;TAKEOKA MASASHI |
分类号 |
H01L21/67;H01L21/304;H01L21/68 |
主分类号 |
H01L21/67 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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