| 摘要 |
PURPOSE:To obtain a flake graphite suitable for a reducing agent especially when silicon nitride is produced by reduction-nitriding silica. CONSTITUTION:In the graphite used for production of ceramics, d002, Lc and La defined by X-ray diffraction are specified respectively to <=3.45A, 10-300A and >=60A, moreover, the thickness measured by a transmission type electron microscope and an electron beam diffraction is specified to <=300A, the ratio (r) of thickness (t) to square root of an area (s) of a face at vertical direction to thickness direction (s<0.5>) is specified to >=3. |
