发明名称 SIGNAL DELAY CIRCUIT
摘要 <p>The circuit for improving the operation speed due to a delay characteristic independent of fluctuations in the voltage supplied includes a driving unit (DRV) connected between a supply voltage (Vcc) and a ground potential (Vss) and having a pull-up PMOS transistor (PM) and a pull-down NMOS transistor (NM) with respective predetermined threshold voltages. The driving unit provides an output signal (Vo) having a voltage swing between the Vcc and Vss to a common drain node of the transistors in response to at lease one input signal (VIN). A varactor load unit (VCL) is coupled to the common drain node, having a capacitance which increases according to the increase of the output signal voltage of the common drain node within a variation range from the threshold voltage of the pull-down NMOS transistor to the supply voltage.</p>
申请公布号 KR930006228(B1) 申请公布日期 1993.07.09
申请号 KR19900011076 申请日期 1990.07.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, YUN - SUNG
分类号 G11C11/4076;H03K4/02;H03K5/00;H03K5/13;H03K19/003;(IPC1-7):H03K5/13 主分类号 G11C11/4076
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