发明名称 INSULATED VIA HOLE STRUCTURE FOR SEMICONDUCTOR DEVICES
摘要 A semiconductor device includes a semiconductor substrate, first and second semiconductor layers of opposite conductivity types successively disposed on the semiconductor substrate, and a via hole structure including a hole penetrating through the first and second semiconductor layers and into the substrate, the via holes being defined by a side wall of the first and second layers and of the substrate, an electrically conducting material disposed on the side wall contacting the first and second semiconductor layers, and an electrically isolating region disposed in the first and second layers at the side wall and contacting the electrically conducting material. The electrically isolating region is formed with an ion flux applied either before or after etching of the via hole.
申请公布号 US5225707(A) 申请公布日期 1993.07.06
申请号 US19910700436 申请日期 1991.05.15
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOMARU, MAKIO;KOBIKI, MICHIHIRO
分类号 H01L29/80;H01L21/338;H01L29/41;H01L29/417;H01L29/812 主分类号 H01L29/80
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