发明名称 METHOD FOR FORMATION OF FINE RESIST PATTERN
摘要 <p>PURPOSE:To provide a method suitable forming fine isolated space resist pattern. CONSTITUTION:The line and space pattern of a fine resist 11 is formed by phase shift method with spacial frequency modulation technique which is effective for formation of fine resist patterns. Then a resist 14 is applied again thereon and is exposed in required areas by using a normal mask to form the fine isolated resist space pattern.</p>
申请公布号 JPH05165223(A) 申请公布日期 1993.07.02
申请号 JP19910333117 申请日期 1991.12.17
申请人 MATSUSHITA ELECTRON CORP 发明人 IKUTA AKIHISA
分类号 G03F7/20;G03F7/26;H01L21/027 主分类号 G03F7/20
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