发明名称 DEVICE MANUFACTURING INVOLVING STEP-AND-SCAN DELINEATION
摘要 Fabrication of submicron design rule large scale integrated circuits depends upon use of a strut-segmented mask with struts providing mechanical support to permit thinned mask segments consequently yielding improved resolution. "Stitching" - positioning of projected segment images to yield a satisfactory continuous image - is aided by lithographically defined skirts forming a continuous border within strut-supported segments.
申请公布号 CA2083112(A1) 申请公布日期 1993.07.01
申请号 CA19922083112 申请日期 1992.11.17
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 BERGER, STEVEN D.;LEVENTHAL, MARVIN;LIDDLE, JAMES A.
分类号 H01J37/305;G03F1/20;G03F7/20;H01L21/027 主分类号 H01J37/305
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