| 摘要 |
1. A method of detecting microdefects in optical waveguides, where an image optical signal, carried through an optical waveguide in form of a signal wave, is reproduced as a coupled signal wave generated by a hologram created by means of inversion of wave front with the use of antiphase reflector, characterised in that the coupled signal wave is carried through another optical waveguide being the tested optical waveguide (10), whereas the obtained image optical signal from the other optical waveguide is compared to the image optical signal from the first optical waveguide being the reference optical waveguide (3).2. A system for detection of macrodefects in optical waveguides, consisting of a optical divider which divides a coherent lightbeam into three beams, a set of flat reflectors and an antiphase reflector, where signal wave obtained from the first beam after being carried through an image diapositive and an optical waveguide interferes with the second beam, whereas the generated hologram generates under the influence of the third beam a coupled signal wave, however, the flat reflectors are spaced in such a manner that the third beam is directed at the hologram coaxially in relation to the second beam but from the opposite direction, characterised in that it consists of two optical waveguides, the reference one (3) and the tested one (10), and an adjustable reflecting element (4), preferably rotary, however, the antiphase reflector (5) is located in the signal wave axis reflected from the adjustable reflecting element (4), whereas the tested optical waveguide (10) is located in the axis of coupled signal wave reflected from the adjustable reflecting element.<IMAGE>
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