发明名称 PHOTOMASK
摘要 <p>PURPOSE:To obtain a photomask which improves the resolution of transfer patterns and is easily formable in the case of stepping of the photomask having isolated patterns as a part of the patterns. CONSTITUTION:Fine 2nd apertures 4, 5 are formed in the peripheral part of a 1st aperture 3 so that the light transmitted through the 1st aperture 3 and the light transmitted through the 2nd apertures 4, 5 interfere with each other by sharpening the light intensity distribution in the position corresponding to the 1st aperture 3 on an imaging plane.</p>
申请公布号 JPH05165194(A) 申请公布日期 1993.06.29
申请号 JP19910330998 申请日期 1991.12.16
申请人 NEC CORP 发明人 TANABE YASUYOSHI
分类号 G03F1/36;G03F1/70;H01L21/027;H01L21/30 主分类号 G03F1/36
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