发明名称 |
METHOD OF CLEANING SILICON SURFACE AT HIGH CLEANNESS AND METHOD OF PLANARIZING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To remove metal impurities beneath the surface of Si, the main cause of surface defects on the Si surface, especially Ni of a transition metal, to make a high-cleanness Si surface and to planarize the Si surface accompanied therewith. SOLUTION: An Si surface containing metal impurities beneath the surface is hydrogenized by the vapor-or liquid-phase method to deposit the metal impurities on the Si surface, and the metal impurities are removed to make a high- cleanness Si surface and planarize it at the atomic level.
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申请公布号 |
JP2001313297(A) |
申请公布日期 |
2001.11.09 |
申请号 |
JP20010051280 |
申请日期 |
2001.02.26 |
申请人 |
NATIONAL INSTITUTE FOR MATERIALS SCIENCE |
发明人 |
HIGAI SHINICHI;ONO TAKAHISA |
分类号 |
H01L21/322;(IPC1-7):H01L21/322 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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