发明名称 METHOD OF CLEANING SILICON SURFACE AT HIGH CLEANNESS AND METHOD OF PLANARIZING THE SAME
摘要 PROBLEM TO BE SOLVED: To remove metal impurities beneath the surface of Si, the main cause of surface defects on the Si surface, especially Ni of a transition metal, to make a high-cleanness Si surface and to planarize the Si surface accompanied therewith. SOLUTION: An Si surface containing metal impurities beneath the surface is hydrogenized by the vapor-or liquid-phase method to deposit the metal impurities on the Si surface, and the metal impurities are removed to make a high- cleanness Si surface and planarize it at the atomic level.
申请公布号 JP2001313297(A) 申请公布日期 2001.11.09
申请号 JP20010051280 申请日期 2001.02.26
申请人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE 发明人 HIGAI SHINICHI;ONO TAKAHISA
分类号 H01L21/322;(IPC1-7):H01L21/322 主分类号 H01L21/322
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