发明名称 Measuring system for dielectric and magnetic properties of materials.
摘要 <p>This system comprises a parallelepipedal dielectric resonator (2), whose two opposite faces and the face joining these faces are conducting. The system also comprises means (16, 18) for exciting the resonator and detecting a signal output by the excited resonator, means (20) for controlling this excitation and measuring the resonant frequency and the quality factor of the resonator using this signal, a conducting casing (22), one face of which is open and placed facing the material investigated (12), and in which are placed the resonator and the excitation and detection means, which makes it possible to determine two of the parameters of the material, given the others. Application to the characterisation of materials for U.H.F. (microwave) components. &lt;IMAGE&gt;</p>
申请公布号 EP0547968(A1) 申请公布日期 1993.06.23
申请号 EP19920403427 申请日期 1992.12.16
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 PHILIPPE, NAUD;GUILLON, PIERRE
分类号 G01N22/00;G01R27/26;H01P7/10 主分类号 G01N22/00
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