TESTING DEVICE OF IC,申请号JP19910112038-传众专利搜索

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发明名称	TESTING DEVICE OF IC
摘要
申请公布号	JPH05152413(A)	申请公布日期	1993.06.18
申请号	JP19910112038	申请日期	1991.05.17
申请人	NEC CORP	发明人	WATANABE TOSHIHIKO
分类号	G01R31/26;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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