| 摘要 |
PURPOSE:To automatically return to the normal operation in case of a runaway in a test state at the normal operation time by disconnecting a test state signal output terminal and an initializing terminal at the time of test operation and connecting them at the time of the normal operation. CONSTITUTION:In the normal operation, due to the entrance of noise in a voltage detection terminal 4, test clock input terminal 5, and command input terminal 6, a malfunction of a test state setting signal output circuit 2 causes any of test state setting signals 1, 2,...n to become a high level, resulting in turning an internal circuit 1 to a test state unexpectedly. However, in this case, a test state signal output terminal 10 sending a low level signal capable of initializing is provided, electrically connecting the terminal 10 and an initializing terminal 3 with a connection line 16. In case of malfunction the initializing terminal becomes low level. Thus, the internal circuit 1 and the test state setting signal output circuit 2 are initialized, resulting in recovering from the test state due to the malfunction. |
