| 摘要 |
<p>PURPOSE:To achieve quicker analysis work by providing a sample base with a sample carrier part on which a sample is carried and a cut piece carrier part to analyze a microscopic cut piece to prevent the microscopic piece from being looked over in a process of taking out or moving the microscopic cut piece. CONSTITUTION:A microscopic cut piece is taken out of a sample sheet 19 fixed on a plate 7 with a microscopic device 5. As the microscopic cut piece is not visible with naked eyes, it is projected on a CRT 9 of a controller 3 with an infrared microscope 2 and taken out with the microscopic device 5 operating an operation panel 11. Subsequently, the microscopic device 5 is operated through the operation panel 11 to place the microscopic cut piece on a base 18 comprising barium fluoride placed in a hole 15. Then, a spectral analysis of the microscopic cut piece is performed by infrared rays radiated from the infrared microscope. Here, an infrared absorption spectrum of the microscopic cut piece is sent to an infrared spectral analyzer 12 through an optical path box 13 to analyze.</p> |
