| 摘要 |
<p>PURPOSE:To obtain an electromagnetic-induction inspecting apparatus, which detects the states of defects, abnormalities and the like of an object under inspection in high sensitivity and in high accuracy by utilizing the characteristics of frequency-phase displacement caused by electromagnetic induction. CONSTITUTION:An electromagnetic-induction inspecting apparatus 1 has an inspecting coil 30 which generates the electromotive force by electromagnetic induction. The states of the presence, abnormalities, defects and the like of a material under inspection S placed in a magnetic field are accurately inspected based on the change in phase of the induced electromotive force with respect to the change in applied power-supply frequency for exciting the electromagnetic induction.</p> |
