发明名称 LOW TEMPERATURE INFRARED SPCTROPHOTOMETER
摘要 PURPOSE:To enable highly sensitive measurement of infrared absorption spectrum of a sample by providing a holding mechanism of liquid sample and a coolant holding mechanism to a surface facing to a total reflection surface of a beam, by forming temperature gradient by which the temperature becomes the more lower the lower the distance from an attenuation total reflection prism is, in the sample, and by solidifying the sample at lower temperature. CONSTITUTION:A frame structure 2 is provided at surroundings of a higher total reflection surface of an attenuation total reflection prism 1 and a coolant holding structure 3 is provided thereon, to introduce the coolant 4. Since thickness of a sample 5 is made to be greater penetration depth of a beam 6, constituent information contained in the sample 5 can be obtained. Thermal conductivity of the holding structure 3 is good and cooling temperature thereof may be transfered to the sample 5. Since the holding structure 3 and the prism 1 contact each other putting a thermal insulation frame 2 in between, the cooling temperature is hardly transfered to the prism 1. Accordingly, the sample 5 begins to solidify from perphery of the holding structure 3 and subsequently solidifies toward the prism 1. In the sample on a surface of the prism 1, there exists high concentration component resulted from segregation and therewith infrared absorption spectrum becomes highly sensitive.
申请公布号 JPH05149871(A) 申请公布日期 1993.06.15
申请号 JP19910312197 申请日期 1991.11.27
申请人 HITACHI LTD 发明人 MIYAHARA YUJI;FUJII TOSHIKO;WATANABE YOSHIO
分类号 G01N21/27 主分类号 G01N21/27
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