| 摘要 |
Reference demodulated signals are applied to the device under test, or reference modulated signals are generated from the output signals of the device under test; each component of the output signals is generated from the output signals of the device under test; each component of the reference modulated signals is generated from the reference modulated signals; and the network properties of the device under test are analyzed based on the components of the output signals and the components of the corresponding reference modulated signals.
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