发明名称 CIRCUIT CONNECTION TEST METHOD AND CIRCUIT CHANGEOVER DEVICE
摘要 <p>PURPOSE:To test the circuit connection of a backup circuit while a main circuit is in a busy state and to verify an input mistake in advance when system information is set to the circuit changeover device. CONSTITUTION:When a circuit connection test is commanded by an entry means of a circuit changeover device 100, a number of a backup circuit 108 is given to a circuit change over device 101 and a code representing the circuit connection test to a subaddress of a terminal equipment 104 connecting to the circuit changeover device 101, and the circuit changeover device 101 confirms the code in the subaddress to identify the connection of the backup circuit 108 by the circuit connection test.</p>
申请公布号 JPH05145630(A) 申请公布日期 1993.06.11
申请号 JP19910329626 申请日期 1991.11.20
申请人 HITACHI TELECOM TECHNOL LTD 发明人 KURIHANA TAKETOSHI
分类号 H04M3/26;H04L12/26 主分类号 H04M3/26
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