发明名称 TEST PATTERN GUARANTEEING SYSTEM
摘要 PURPOSE:To generate data with high quality in a short period by pointing out and correcting the verification of a pattern with possibility to generate a trouble in point of timing in a test. CONSTITUTION:A contravention rule 3 is acquired in a contravention rule acquiring process 2, and an expected value is generated for a test pattern 4 without expected value in a simulation process 5. and a test pattern 6 with expected value is outputted. Thence, in a contravention pattern detection process 9, continuous two test patterns are compared based on the contravention rule 3, and what change of the value of which terminal is checked, and a part with the trouble in point of timing is detected. The part with the trouble is outputted setting a pattern number, an error content, and the change status of a terminal and a value, etc., as error information 11 in a rule contravention pattern output process 10. When the error occurs, the pattern is corrected in a manual pattern correction process 12, and the verification is performed with a verification system 1 again.
申请公布号 JPH05143672(A) 申请公布日期 1993.06.11
申请号 JP19910332744 申请日期 1991.11.22
申请人 NEC CORP 发明人 WATANABE JUNKO
分类号 G06F11/22;G06F11/25;G06F11/26;G06F17/50 主分类号 G06F11/22
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