| 摘要 |
The test circuit reduces the test time of the analog/digital converter in one-chip microcomputer. The circuit includes an A/D test load register (122) for loading the digital value corresponding to the analog voltage level for testing, a first multiplexer (128) for providing a D/A converter (104) with the output of the A/D test load register or the output of a control logic (106), a second multiplexer (121) for selecting the output of the D/A converter, an A/D test mode register (120) for controlling the second multiplexer, an exclusive NOR result register (107) and A/D test load register, and an A/D test error register (123) for setting the interrupt flag result in accordance with the output of the exclusive NOR gate.
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