发明名称 Measuring appts. for determining angular dependence of secondary radiation intensity - has axially symmetrical reflector and cuvette, with aperture and angularly selective optical element in direction of secondary radiation
摘要 The reflector has a reflecting wall extending towards one side. The vol. to be tested is placed in a cuvette (5) within the reflector, symmetrical to the axis of symmetry of the reflector. The axis of symmetry of the reflector represents the optical axis of the entire system. The concentrated prim. beam (21) is led at a desired angle through the optical axis at the height of the vol. to be tested. The sec. radiation from the vol. under test is reflected at the reflector wall. A diaphragm (12) aperture is positioned in the direction of the sec. radiation, after its reflection at the reflector, and an angle selecting optical element is provided. A detector for the sec. radiation is provided in the same direction after the diaphragm and angle selecting optical element. ADVANTAGE - System is compact and light. Determination of intensity of sec. radiation is facilitated over entire angular range of 0-360 deg.
申请公布号 DE4139796(A1) 申请公布日期 1993.06.09
申请号 DE19914139796 申请日期 1991.12.03
申请人 BRINKMANN, DIRK, DIPL.-CHEM., 4130 MOERS, DE;BORCHARD, WERNER, PROF. DR., 4220 DINSLAKEN, DE 发明人 BRINKMANN, DIRK, DIPL.-CHEM., 4130 MOERS, DE;BORCHARD, WERNER, PROF. DR., 4220 DINSLAKEN, DE
分类号 G01N21/51 主分类号 G01N21/51
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