| 摘要 |
PURPOSE:To make it possible to specify a failure spot easily when abnormality is detected in a test of a shift path. CONSTITUTION:A selector circuit 16 of LSI 1 selects one of an output signal from a logic sum circuit 15 taking the logic sum of an output signal of an error register 13, and an output signal of a shift-out-side register 14, in accordance with a shift mode signal 402 from diagnosis control LSI 4. The selector circuit 14 selects the output signal of the shift-out-side register 14 at the time of a shift operation and outputs it as an LSI representation error signal to the diagnosis control LSI 4. An error representation register 42 of the diagnosis control LSI 4 stores the LSI representation error signal from each of LSIs 1 to 3. A diagnosis control circuit 41 judges the existence or nonexistence of a failure of a shift path of each of the LSIs 1 to 3 at the time of the shift operation on the basis of an output signal of the error representation register 42. |
