发明名称 Method of producing a semiconductor structure including a Schottky junction
摘要 A method of producing a Schottky junction including a semiconductor substrate and a metal film includes successively producing on a semiconductor substrate a first insulating film, a second film having a different etching speed from that of the first insulating film, and a third insulating film having a different etching speed from that of said second film, exposing a part of the second film by dry etching the third insulating film, etching the second film using the third insulating film as a mask to expose part of the first insulating film, dry etching the first insulating film to expose part of the substrate, and producing a metal film forming a Schottky junction with the substrate on the exposed part of the semiconductor substrate.
申请公布号 US5217911(A) 申请公布日期 1993.06.08
申请号 US19910676115 申请日期 1991.03.27
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 DENDA, MASAHIKO
分类号 H01L21/302;H01L21/28;H01L21/306;H01L21/3065;H01L21/329;H01L21/8222;H01L21/8234;H01L27/06;H01L29/47;H01L29/872 主分类号 H01L21/302
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